幫助文檔
[應用文獻] Electron diffraction data acquisition（ASI探測器TEM ED應用）
發(fā)布時間：2018-08-15
Electron diffraction data acquisition. (a) Measured powder pattern of an aluminium diffraction standard after correcting for the tiling offsets of the Timepix quad ASICs. An elliptical distortion can be observed with a deviation of 1.043 (= A/B) at an angle of φ = 21.3°. Diffraction from the single lysozyme crystal summed over 1.0° of rotation (b) from ?17.0° to ?16.0° and (c) from ?6.0 to ?5.0°. Crosses on individual quads are owing to corrections for larger border pixels as described by Nederlof et al. (2013) and van Genderen et al. (2016); these pixels were not taken into account for processing of the protein diffraction data. Note that owing to the radiation hardness of the detector, no backstop was required. Resolution rings were plotted with ADXV. (d) A typical spot profile of a high-intensity peak at 16.33?? resolution recorded on a single frame with an angular increment of 0.076° per frame at a dose rate of ～0.01?e????2 per frame, shown in a 10 × 10 pixel array with 0.055 × 0.055?mm pixel size. [Clabbers, M. T. B., van Genderen, E., Wan, W., Wiegers, E. L., Gruene, T. and Abrahams, J. P. (2017). Acta Cryst. D73, 738-748. doi:10.1107/S2059798317010348]
南京覃思科技有限公司總部
地址：南京市中山北路281號新城市廣場虹橋中心2-728B
南京覃思科技有限公司北京分公司
微信咨詢